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2-10.Cracks

2.Definition of Dimensional Properties,Terminology and Methods of Silicon Carbide Wafer

2-10.Cracks

2018-01-08

A fracture or cleavage of the wafer that extends from the frontside surface of the wafer to the back-side surface of the wafer. Cracks must exceed 0.010” in length under high intensity illumination in order to discriminate fracture lines from allowable crystalline striations. Fracture lines typically exhibit sharp, thin lines of propagation,which discriminate them from material striations.

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