FZ polished wafers, mainly for the production of silicon rectifier (SR), silicon controlled rectifier (SCR), Giant Transistor (GTR), thyristor (GRO)
Polished wafer
FZ polished wafers, mainly for the production of silicon rectifier (SR), silicon controlled rectifier (SCR), Giant Transistor (GTR), thyristor (GRO)
Our advantages at a glance
1.Advanced epitaxy growth equipment and test equipment.
2.Offer the highest quality with low defect density and good surface roughness.
3.Strong research team support and technology support for our customers
FZ polished wafers Specifications
Type |
Conduction type |
Orientation |
Diameter scope(mm) |
Resistivity scope(Ω cm) |
Geometric parameter graininess,surface metal |
FZ |
N&P |
<100>&<111> |
76.2-200 |
>1000 |
T≥260(um) TTV≤2(um) TIR≤2(um) STIR≤1(um)(20*20) Graininess≤10pcs(≥0.3um) , ≤20pcs(≥0.2um) Surface metal≤5E10/cm2 BSD:Etchpit density>1E106pcs/cm2 Poly:5000-12000 A |
NTDFZ |
N |
<100>&<111> |
76.2-200 |
30-800 |
|
CFZ |
N&P |
<100>&<111> |
76.2-200 |
1-50 |
|
GDFZ |
N&P |
<100>&<111> |
76.2-200 |
0.001-300 |
CZ polished wafers Specifications
Type
Conduction type
Orientation
Diameter
scope(mm)
Resistivity
scope(Ω cm)
Geometric
parameter graininess,surface metal
MCZ
N&P
<100>
<110>&<111>
76.2-200
1-300
T≥260(um) TTV≤2(um) TIR≤2(um)
STIR≤1(um)(20*20) Graininess≤10pcs(≥0.3um) , ≤20pcs(≥0.2um) Surface metal≤5E10/cm2 BSD:Etchpit density>1E106pcs/cm2 LTO:3500~8000±250A
CZ
N&P
<100>
<110>&<111>
76.2-200
1-300
MCZ heavily
doped
N&P
<100>&<111>
76.2-200
0.001-1