Home / News /

Structure for InGaAs photodetectors

News

Structure for InGaAs photodetectors

2015-12-13

We offer the wafer structure InGaAs photodetectors as follows:


Material

X

Thickness (nm)

Dopant

Doping concentration

InP

1000

N (Sulfur)

3E+16

In(x)GaAs

0.53

3000

U/D

5E+14

InP

500

N (Sulfur)

3E+16

Substrate

SI (Fe)


Source: semiconductorwafers.net


For more information, please visit our website:http://www.semiconductorwafers.net,

send us email at angel.ye@powerwaywafer.com or powerwaymaterial@gmail.com.


Contact Us

If you would like a quotation or more information about our products, please leave us a message, will reply you as soon as possible.
   
Contact Us Contact Us 
If you would like a quotation or more information about our products, please leave us a message, will reply you as soon as possible.