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2-21.Usable Area

2.Definition of Dimensional Properties,Terminology and Methods of Silicon Carbide Wafer

2-21.Usable Area

2018-01-08

A cumulative subtraction of all noted defect areas from the frontside wafer quality area within the edge exclusion zone. The remaining percent value indicates the proportion of the frontside surface to be free of all noted defects (does not include edge exclusion).

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